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Updated: Jun 15, 2026

Selective Area Modification of Silicon Surface Wettability by Pulsed UV Laser Irradiation in Liquid Environment
Published on: November 9, 2015
Infrared optical properties of silicon monoxide films
Abstract:
The dielectric function epsilon identical with epsilon(1) + iepsilon(2) of evaporated SiO films is reported for the wavelength region from 8 to 33 microm. The data are based on spectrophotometric measurements of reflectance and transmittance for films evaporated onto KRS-5 and crystalline Si and on reflectance measurements on films evaporated onto opaque Al layers. The consistency in the results for epsilon(1) and epsilon(2) is verified by the Kramers-Kronig analysis.
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