Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Mechano-mechanical parametric coupling in MEMS between GHz and kHz frequency regimes at room temperature.

Microsystems & nanoengineering·2026
Same author

Low-temperature AFM with a microwave cavity optomechanical transducer.

Beilstein journal of nanotechnology·2025
Same author

Design, fabrication, and characterization of kinetic-inductive force sensors for scanning probe applications.

Beilstein journal of nanotechnology·2024
Same author

Multipartite Entanglement in a Microwave Frequency Comb.

Physical review letters·2023
Same author

Intermodal coupling spectroscopy of mechanical modes in microcantilevers.

Beilstein journal of nanotechnology·2023
Same author

Measurement and control of a superconducting quantum processor with a fully integrated radio-frequency system on a chip.

The Review of scientific instruments·2022

Related Experiment Video

Updated: Jun 15, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Phase imaging with intermodulation atomic force microscopy.

Daniel Platz1, Erik A Tholén, Carsten Hutter

  • 1Nanostructure Physics, Royal Institute of Technology, Stockholm, Sweden.

Ultramicroscopy
|March 16, 2010
PubMed
Summary
This summary is machine-generated.

Intermodulation atomic force microscopy (IMAFM) uses two-tone excitation to reveal enhanced surface details. This technique generates intermodulation products (IMPs), enabling phase imaging for improved topographic and material contrast.

More Related Videos

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Related Experiment Videos

Last Updated: Jun 15, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Area of Science:

  • Surface science
  • Nanotechnology
  • Microscopy

Background:

  • Atomic force microscopy (AFM) is a powerful tool for nanoscale imaging.
  • Dynamic AFM modes offer advanced capabilities for surface characterization.
  • Nonlinear tip-sample interactions are crucial for advanced AFM techniques.

Purpose of the Study:

  • To introduce a method for extracting phase information from intermodulation products (IMPs) in AFM.
  • To demonstrate the utility of IMP phase imaging for enhanced surface analysis.
  • To showcase the improved topographic and material contrast achievable with IMP imaging.

Main Methods:

  • Utilizing intermodulation atomic force microscopy (IMAFM) with two-tone excitation.
  • Implementing a procedure to extract the phase of IMPs from cantilever response.
  • Generating phase images by recording IMP phase during surface scanning.

Main Results:

  • Successfully extracted phase information at intermodulation frequencies.
  • Demonstrated the creation of phase images using IMP data.
  • Observed enhanced topographic and material contrast in amplitude and phase images at IMPs.

Conclusions:

  • IMAFM with IMP phase imaging provides superior surface characterization.
  • The presented method enhances the sensitivity of AFM to surface properties.
  • IMAFM offers a promising approach for detailed nanoscale material analysis.