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Determination of the refractive index of a dielectric film continuously by the generalized S-transform
Emre Coşkun1, Kivanç Sel, Serhat Ozder
1Department of Physics, Canakkale Onsekiz Mart University, 17100 Canakkale, Turkey. ecoskun@comu.edu.tr
Abstract:
The generalized S-transform was improved as a method to determine the refractive index of a dielectric film continuously by using the transmittance spectrum, and the applicability of the method was demonstrated on mica. The result determined from the generalized S-transform method was compared with the results determined from the S-transform and the fringe counting methods and published values. The advantage of the proposed method was explained, and the absolute error of the presented method was also calculated.
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