The self-adjusting file (SAF). Part 3: removal of debris and smear layer-A scanning electron microscope study

Zvi Metzger1, Ehud Teperovich, Raphaela Cohen

  • 1Department of Endodontology, The Goldschleger School of Dental Medicine, Tel Aviv University, Tel Aviv, Israel. metzger@post.tau.ac.il

Journal of Endodontics
|March 24, 2010
PubMed
Abstract