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Interferometric comparison of displacements by electronic speckle pattern interferometry.

O J Løkberg, G A Slettemoen

|March 25, 2010

Summary

This study introduces a novel electronic speckle pattern interferometer (ESPI) method for measuring relative object displacement. The technique allows for direct interferometric addition and subtraction of vibration patterns, enabling new applications in displacement measurement.

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Area of Science:

Optical Metrology
Experimental Physics
Interferometry

Background:

Electronic Speckle Pattern Interferometry (ESPI) is a technique used for non-contact measurement of surface displacements.
Traditional ESPI setups typically analyze a single object's deformation relative to a static state.

Purpose of the Study:

To develop and demonstrate a novel ESPI technique for measuring relative displacement between two similar objects.
To showcase the direct interferometric subtraction and addition of vibration patterns.

Main Methods:

Utilizing image waves from two similar objects as object and reference waves in an ESPI setup.
Acquiring and analyzing interference patterns generated by the relative displacement.

Main Results:

Successfully obtained interference patterns indicating the relative displacement between two objects.
Demonstrated experimental results for direct interferometric subtraction and addition of vibration patterns.

Conclusions:

The proposed ESPI method effectively measures relative displacement between similar objects.
The technique offers potential for new applications in vibration analysis and displacement metrology.