Related Experiment Video

Updated: Jun 14, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Influence of pinholes on MgO-tunnel junction barrier parameters obtained from current-voltage characteristics

J Ventura1, J M Teixeira, J P Araujo

  • 1IN, IFIMUP Unit, Rua do Campo Alegre, 687, 4169-007, Porto, Portugal.

Journal of Nanoscience and Nanotechnology
|April 2, 2010
PubMed

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