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Detecting nonuniformity in small welds and solder seams using optical correlation and electronic processing.

J W Wagner

    Applied Optics
    |April 8, 2010
    PubMed
    Summary

    This study introduces a holographic method to detect tiny surface changes in microcircuit seams under stress. The technique correlates optical signals with solder adhesion, offering a new way to inspect for flaws in small seams.

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    Area of Science:

    • Materials Science
    • Optical Engineering
    • Non-Destructive Testing

    Background:

    • Hermetic microcircuit packages require robust seam integrity for reliability.
    • Current inspection methods for small seams may be limited in sensitivity and scope.
    • Understanding the relationship between seam uniformity and mechanical stress is crucial.

    Purpose of the Study:

    • To develop and validate an optical technique for detecting micro-displacements in microcircuit seams.
    • To correlate optical signal variations with the physical characteristics of solder seams.
    • To assess the potential of this technique for non-destructive inspection of micro-welded and soldered seams.

    Main Methods:

    • Utilized holographic matched filtering for optical analysis.

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  • Employed electronic processing for signal detection and interpretation.
  • Performed stress application on hermetic microcircuit package seams.
  • Conducted destructive analysis of solder-sealed packages to correlate findings.
  • Main Results:

    • Successfully detected small variations in surface displacement along stressed seams.
    • Established a strong correlation between optical signal changes and nonuniform solder adhesion/wetting.
    • Demonstrated the sensitivity of the holographic technique to seam imperfections.

    Conclusions:

    • Holographic matched filtering with electronic processing is effective for detecting seam flaws.
    • The technique shows promise for non-destructive evaluation of microcircuit seams.
    • This method can identify issues related to solder adhesion and wetting uniformity.