Characterization of a direct detection device imaging camera for transmission electron microscopy
Related Experiment Video
Updated: Jun 14, 2026

Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope
Published on: March 16, 2022
Anna-Clare Milazzo1, Grigore Moldovan, Jason Lanman
1University of California at San Diego, 9500 Gilman Dr., La Jolla, CA 92093, USA. amilazzo@ncmir.ucsd.edu
Abstract:
The complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 keV. Unlike a standard charge coupled device (CCD) camera, this device does not require a scintillator. The DDD transfers signal up to 65 lines/mm providing the basis for a high-performance platform for a new generation of wide field-of-view high-resolution cameras. An image of a thin section of virus particles is presented to illustrate the substantially improved performance of this sensor over current indirectly coupled CCD cameras.
Related Concept Videos
Transmission Electron Microscopy
Overview of Electron Microscopy
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Overview of Microscopy Techniques
Determination of Crystal Structures
