Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Hydrolytic and enzymatic degradation of linear segmented polyurethane block copolymers studied by ToF-SIMS and atomic force microscopy.

Biointerphases·2025
Same author

ToF-SIMS analysis of ultrathin films and their fragmentation patterns.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society·2024
Same author

Quantitative evaluation of perfluorinated alkanethiol molecular order on gold surfaces.

Biointerphases·2023
Same author

XPS and ToF-SIMS Characterization of New Biodegradable Poly(Peptide-Urethane-Urea) Block Copolymers.

Advanced healthcare materials·2021
Same author

Developments and Ongoing Challenges for Analysis of Surface-Bound Proteins.

Annual review of analytical chemistry (Palo Alto, Calif.)·2021
Same author

Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene.

Journal of vacuum science & technology. A, Vacuum, surfaces, and films : an official journal of the American Vacuum Society·2020

Related Experiment Video

Updated: Jun 14, 2026

In Situ Characterization of Shewanella oneidensis MR1 Biofilms by SALVI and ToF-SIMS
09:56

In Situ Characterization of Shewanella oneidensis MR1 Biofilms by SALVI and ToF-SIMS

Published on: August 18, 2017

ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam Analysis.

J Brison1, S Muramoto, David G Castner

  • 1National ESCA and Surface Analysis Center for Biomedical Problems, University of Washington, Department of Chemical Engineering, Box 351750, Seattle, WA 98195.

The Journal of Physical Chemistry. C, Nanomaterials and Interfaces
|April 13, 2010
PubMed
Summary

Minimizing sample damage during dual-beam depth profiling is crucial. Researchers found that keeping the analysis beam fluence below 0.03 times the total ion fluence (R=0.03) minimizes damage and maintains good depth resolution for organic films.

More Related Videos

Automated 3D Optical Coherence Tomography to Elucidate Biofilm Morphogenesis Over Large Spatial Scales
09:56

Automated 3D Optical Coherence Tomography to Elucidate Biofilm Morphogenesis Over Large Spatial Scales

Published on: August 21, 2019

In Situ Characterization of Hydrated Proteins in Water by SALVI and ToF-SIMS
09:48

In Situ Characterization of Hydrated Proteins in Water by SALVI and ToF-SIMS

Published on: February 15, 2016

Related Experiment Videos

Last Updated: Jun 14, 2026

In Situ Characterization of Shewanella oneidensis MR1 Biofilms by SALVI and ToF-SIMS
09:56

In Situ Characterization of Shewanella oneidensis MR1 Biofilms by SALVI and ToF-SIMS

Published on: August 18, 2017

Automated 3D Optical Coherence Tomography to Elucidate Biofilm Morphogenesis Over Large Spatial Scales
09:56

Automated 3D Optical Coherence Tomography to Elucidate Biofilm Morphogenesis Over Large Spatial Scales

Published on: August 21, 2019

In Situ Characterization of Hydrated Proteins in Water by SALVI and ToF-SIMS
09:48

In Situ Characterization of Hydrated Proteins in Water by SALVI and ToF-SIMS

Published on: February 15, 2016

Area of Science:

  • Materials Science
  • Surface Analysis
  • Analytical Chemistry

Background:

  • Dual-beam depth profiling uses separate analysis and etching beams.
  • High energy analysis beams can induce sample damage, complicating depth profiling.
  • Maintaining depth resolution while minimizing analysis beam damage is a persistent challenge.

Purpose of the Study:

  • To investigate the relationship between analysis beam fluence and sample damage in dual-beam depth profiling.
  • To introduce a parameter (R) to quantify damage in organic systems.
  • To determine optimal parameters for minimizing damage and maximizing depth resolution.

Main Methods:

  • Utilized a plasma polymerized tetraglyme film as a model organic system.
  • Employed dual-beam depth profiling with Bi(n)+ (n=1, 3) and C(60)+ ion beams.
  • Introduced and varied the dimensionless parameter R (analysis beam fluence / total ion fluence).

Main Results:

  • Increasing the R parameter, by increasing analysis beam fluence, led to increased sample damage.
  • Minimal damage accumulation was observed for R values up to 0.03.
  • A best depth resolution of 8 nm was achieved at R=0.03.
  • Higher R values degraded molecular signals and reduced depth resolution at the polymer/substrate interface.

Conclusions:

  • The dimensionless parameter R effectively quantifies damage in dual-beam depth profiling.
  • Operating below R=0.03 is critical for minimizing damage and achieving high depth resolution in organic materials.
  • Optimizing the ratio of analysis to etching beam fluence is essential for accurate depth profiling.