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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.

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Related Experiment Video

Updated: Jun 13, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

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Published on: July 17, 2015

Reducing scanning electron microscope charging by using exponential contrast stretching technique on post-processing

K S Sim1, Y Y Tan, M A Lai

  • 1Faculty of Engineering & Technology, Multimedia University, Melaka, Malaysia. sksbg2003@yahoo.com

Journal of Microscopy
|April 14, 2010
PubMed
Summary
This summary is machine-generated.

An improved exponential contrast stretching (ECS) technique effectively reduces charging artifacts in scanning electron microscope (SEM) images. This new method outperforms traditional histogram equalization for clearer image compensation.

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Last Updated: Jun 13, 2026

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Area of Science:

  • Materials Science
  • Image Processing
  • Microscopy

Background:

  • Scanning Electron Microscopy (SEM) is crucial for high-resolution imaging.
  • Charging effects in SEM can degrade image quality, especially on insulating surfaces.
  • Existing histogram equalization methods have limitations in artifact reduction.

Purpose of the Study:

  • To develop a novel image processing technique to mitigate charging effects in SEM.
  • To enhance the quality and interpretability of SEM images.
  • To compare the proposed method against conventional techniques.

Main Methods:

  • An Exponential Contrast Stretching (ECS) technique was developed.
  • The ECS algorithm was implemented in software with a frame grabber card.
  • Performance was evaluated using diode sample chips with both insulating and conductive surfaces.

Main Results:

  • The proposed ECS technique demonstrated superior image compensation compared to bi-histogram equalization and recursive mean-separate histogram equalization.
  • Effective reduction of charging artifacts was observed on tested samples.
  • The algorithm provided better overall image quality and contrast.

Conclusions:

  • Exponential Contrast Stretching (ECS) is an effective method for reducing SEM charging artifacts.
  • The developed technique offers an advancement over existing histogram equalization methods for SEM image enhancement.
  • This approach improves the reliability of SEM analysis, particularly for challenging samples.