Measurement of potential distribution function on object surface by using an electron microscope in the mirror

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

S A Nepijko1, G Schönhense

  • 1Institute of Physics, University Mainz, Staudingerweg 7, 55099 Mainz, Germany. nepijko@uni-mainz.de

Journal of Microscopy
|April 14, 2010
PubMed

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