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Journal of Microscopy|April 14, 2010
Measurement of potential distribution function on object surface by using an electron microscope in the mirror operation modeS A Nepijko, G SchönhenseJournal of Microscopy|September 14, 2001
Peculiarities of imaging one- and two-dimensional structures using an electron microscope in the mirror operation modeS A Nepijko, N N Sedov, G SchönhenseJournal of Microscopy|July 4, 2003
Measurement of the electric field distribution and potentials on the object surface in an emission electron microscope without restriction of the electron beamsS A Nepijko, A Gloskovskii, N N Sedov, et al.Journal of Microscopy|May 10, 2002
Use of emission electron microscope for potential mapping in semiconductor microelectronicsS A Nepijko, N N Sedov, G Schönhense, et al.Journal of Microscopy|December 16, 2010
Quantitative measurements of magnetic stray field dynamics of Permalloy particles in a photoemission electron microscopyS A Nepijko, A Krasyuk, A Oelsner, et al.Journal of Microscopy|April 5, 2008
High-pass energy-filtered photoemission electron microscopy imaging of dopants in siliconM Hovorka, L Frank, D Valdaitsev, et al.Journal of Microscopy|June 26, 2001
Imaging of three-dimensional objects in emission electron microscopyS A Nepijko, N N Sedov, O Schmidt, et al.Applied Optics|May 3, 2019
Matching emission centers of electrons and photons in current-carrying silver nanoparticle filmsS A Nepijko, S V Chernov, I V Cheshko, et al.Physical Review Letters|December 31, 2005
Self-trapping of magnetic oscillation modes in Landau flux-closure structuresA Krasyuk, F Wegelin, S A Nepijko, et al.Physical Chemistry Chemical Physics : PCCP|July 3, 2015
Donor-anion interactions at the charge localization and charge ordering transitions of (TMTTF)2AsF6 probed by NEXAFSK Medjanik, A Chernenkaya, S A Nepijko, et al.Pageof 5