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Updated: Jun 13, 2026

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Tristan Colomb1, Stefan Krivec, Herbert Hutter
1Lyncée Tec SA, PSE-A, CH-1015 Lausanne, Switzerland.
Dual-wavelength digital holographic microscopy (DHM) measures micro-structure topography, layer thicknesses, and refractive indices. This advanced DHM reflectometry technique analyzes complex wave propagation through multi-layered specimens.
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