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Updated: Jun 13, 2026

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
Published on: November 30, 2012
Losses and group index dispersion in insulator-on-silicon-on-insulator ridge waveguides
Daniel Pergande1, Ralf B Wehrspohn
1Institute of Physics, Martin-Luther-University Halle-Wittenberg, 06099 Halle, Germany. daniel.pergande@physik.uni-halle.de
Abstract:
We present polarization-dependent optical transmission properties of a completely symmetric silicon-on-insulator (SOI) microphotonic material system. In contrast to typical SOI based photonic materials, here an insulator-on-silicon-on-insulator (IOSOI) material system has been fabricated. This symmetric structure exhibits average losses between 1510 and 1630 nm of around 0.5 dB/mm for TE and 0.3 dB/mm for TM-polarization. The good transmission for TM-polarization can be explained by the thick insulting cladding layer of 3 microm thickness. Moreover, group index dispersion diagrams are presented and discussed for both polarizations.
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