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Updated: Jun 13, 2026

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
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Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

Published on: September 8, 2023

Far-field polarization-based sensitivity to sub-resolution displacements of a sub-resolution scatterer in tightly

Oscar G Rodríguez-Herrera1, David Lara, Chris Dainty

  • 1Applied Optics, School of Physics, National University of Ireland, Galway, University Road, Galway, Ireland. oscar.rodriguez@nuigalway.ie

Optics Express
|April 15, 2010
PubMed

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