Inspection of complex surfaces by means of structured light patterns

Yannick Caulier1

  • 1Department Process Integrated Inspection Systems Fraunhofer Institute for Integrated Circuits IIS, D-91058 Erlangen, Germany. yannick.caulier@iis.fraunhofer.de

Optics Express
|April 15, 2010
PubMed
Summary

This study enhances structured light surface inspection for free-form shapes. The new method improves classification accuracy for rough and specular surfaces using optimized feature selection.