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Optics Express
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April 15, 2010
Inspection of complex surfaces by means of structured light patterns
Yannick Caulier
IEEE Transactions on Pattern Analysis and Machine Intelligence
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August 18, 2010
Visually inspecting specular surfaces: A generalized image capture and image description approach
Yannick Caulier, Salah Bourennane
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Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Optics Express
|
April 15, 2010
Inspection of complex surfaces by means of structured light patterns
Yannick Caulier
IEEE Transactions on Pattern Analysis and Machine Intelligence
|
August 18, 2010
Visually inspecting specular surfaces: A generalized image capture and image description approach
Yannick Caulier, Salah Bourennane
Page
of 1