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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Coherent diffraction surface imaging in reflection geometry.

Shashidhara Marathe1, S S Kim, S N Kim

  • 1Department of Materials Science and Engineering & Nano-bio Materials and Electronics, Gwangju Institute of Science and Technology, Gwangju, 500-712 Korea.

Optics Express
|April 15, 2010
PubMed
Summary
This summary is machine-generated.

This study introduces a reflection-based coherent diffraction imaging technique to reconstruct surface images from reflected light intensity. This method allows for quantitative surface profiling without prior sample knowledge, expanding imaging applications.

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Surface Science

Background:

  • Coherent diffraction imaging (CDI) is a powerful lensless imaging technique.
  • Traditional CDI often requires transmission geometry or prior knowledge of the sample.
  • Limited penetration depth of light sources restricts CDI applications for certain materials and surfaces.

Purpose of the Study:

  • To develop and demonstrate a reflection-based CDI method for reconstructing non-periodic surface images.
  • To enable quantitative surface profiling using only reflected intensity data.
  • To extend the applicability of CDI to scenarios with limited light penetration.

Main Methods:

  • Utilized a reflection geometry for measuring diffraction amplitude.
  • Employed a He-Ne laser as the coherent light source.
  • Reconstructed surface images from measured diffraction intensity without prior object information.

Main Results:

  • Successfully reconstructed a non-periodic surface image solely from reflected intensity.
  • Demonstrated the ability to obtain a quantitative phase image of the exit wave.
  • Showcased the potential for determining surface depth profiles or phase changes.

Conclusions:

  • The developed reflection-based CDI method effectively reconstructs surface images.
  • This technique provides quantitative surface information without needing prior knowledge of the sample.
  • The method broadens the application scope of CDI, especially for samples where light penetration is limited.