Silicon photodiode absolute spectral response self-calibration using a filtered tungsten source.

Area of Science:

• Optical physics
• Metrology
• Solid-state devices

Background:

• Silicon photodiodes are crucial for optical measurements.
• Absolute spectral response calibration is essential for accurate radiometry.
• Existing self-calibration methods are often limited to laser wavelengths.

Purpose of the Study:

• To extend silicon photodiode absolute spectral response self-calibration techniques to non-laser wavelengths.
• To establish a reliable method for spectral response calibration using a filtered tungsten source.
• To validate the accuracy and applicability of the new calibration method.

Main Methods:

• Utilized a tungsten source filtered with narrow, well-characterized interference filters.
• Applied self-calibration techniques to silicon photodiodes using the filtered tungsten source.
• Compared results with photodiodes calibrated using a laser source and a pyroelectric radiometer.

Main Results:

• Demonstrated successful self-calibration of silicon photodiodes using filtered tungsten radiation.
• Achieved an absolute spectral response scale from 0.400 to 0.800 micrometers with uncertainty better than +/-1.0%.
• Verified results against a spectrally flat pyroelectric radiometer calibrated at a He-Ne laser wavelength.

Conclusions:

• The described method effectively extends absolute spectral response self-calibration to non-laser wavelengths.
• The technique provides an accurate and independent spectral response scale, free from reliance on lamp standards or blackbody detectors.
• This method is accessible for use in moderately equipped laboratories.