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Interference effects in luminescence studies of thin films
Applied Optics
|April 17, 2010
Summary
Interference effects in thin films cause luminescence fringes. This study models polarized light emission, revealing thickness and wavelength-dependent fringe patterns in materials like silicon dioxide and amorphous silicon.
Area of Science:
- Optics and Photonics
- Materials Science
Background:
- Thin films exhibit unique optical properties due to wave interference.
- Luminescence from thin films can be modulated by interference effects.
Purpose of the Study:
- To describe interference effects in thin-film luminescence.
- To model polarized light emission and its dependence on film properties.
Main Methods:
- A simple geometrical model was developed to calculate s- and p-polarized luminescent light.
- The model assumes electric-dipole radiation from within the thin film.
Main Results:
- Luminescence fringes were observed as a function of film thickness.
- Fringes were also observed as a function of wavelength, sometimes showing a beating effect.
- The model was validated with experimental cathodoluminescence in SiO(2) and photoluminescence in a-Si.
Conclusions:
- Interference significantly impacts thin-film luminescence.
- The developed geometrical model accurately predicts observed fringe patterns.
- This work provides insights into light emission from thin film materials.
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