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The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
Published on: December 5, 2025
Narcissus: reflections on retroreflections in thermal imaging systems
1Honeywell, Electro-Optics Operations, 2 Forbes Road, Lexington, Massachusetts 02173, USA.
Applied Optics
|April 17, 2010
Summary
Narcissus is an artifact in thermal imaging caused by background radiation reflections. This study quantifies the narcissus effect using paraxial formulas and spectral response, providing its equivalent scene temperature difference (NARCDeltaT).
Area of Science:
- Optical Engineering
- Infrared Technology
- Radiometry
Background:
- Narcissus is an artifact in scanning thermal imaging systems.
- It arises from background radiation reflecting off optical surfaces and reaching detectors.
- This effect creates self-images or 'ghosts' within the thermal data.
Purpose of the Study:
- To develop a method for quantifying the narcissus effect in thermal imaging systems.
- To determine the narcissus artifact's intensity and size.
- To relate the artifact to system parameters like spectral response and f/No.
Main Methods:
- Derivation of paraxial surface-contribution formulas based on Lagrange invariants.
- Integration of system spectral response with optical surface data.
- Calculation of narcissus equivalent scene temperature difference (NARCDeltaT).
Main Results:
- Formulas accurately predict narcissus intensity and size using paraxial ray data.
- The equivalent scene temperature difference (NARCDeltaT) quantifies the narcissus effect.
- Gaussian formulation simplifies analysis, reducing the need for extensive ray tracing.
Conclusions:
- The developed method provides a radiometrically accurate way to characterize narcissus.
- Paraxial formulas offer an efficient alternative to complex ray tracing for narcissus analysis.
- Understanding and quantifying narcissus is crucial for accurate thermal imaging interpretation.
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