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Scanning electron microscopy of Setaria cervi adult male worms

A J Almeida1, K P Deobhankar, M K Bhopale

  • 1Haffkine Institute, Department of Zoonosis, Parel, Bombay, India.

International Journal for Parasitology
|February 1, 1991
PubMed

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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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