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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
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Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Related Experiment Video

Updated: Jun 13, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

New area detector for atomic-resolution scanning transmission electron microscopy.

Naoya Shibata1, Yuji Kohno, Scott D Findlay

  • 1Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Bunkyo, Tokyo 113-8656, Japan. shibata@sigma.t.u-tokyo.ac.jp

Journal of Electron Microscopy
|April 22, 2010
PubMed
Summary

A novel detector for atomic-resolution scanning transmission electron microscopy (STEM) enables simultaneous acquisition of 16 images. This breakthrough allows for enhanced electron scattering analysis and new imaging possibilities in materials science.

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Last Updated: Jun 13, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Published on: May 10, 2021

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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

Area of Science:

  • Materials Science
  • Electron Microscopy
  • Physics

Background:

  • Atomic-resolution imaging is crucial for understanding material properties at the nanoscale.
  • Current detectors in scanning transmission electron microscopy (STEM) have limitations in capturing the full spectrum of scattered electrons.
  • Developing advanced detectors is essential for pushing the boundaries of materials characterization.

Purpose of the Study:

  • To develop and test a new segmented area detector for atomic-resolution STEM.
  • To enable simultaneous acquisition of multiple images sensitive to electron scattering distributions.
  • To explore novel applications in materials imaging and analysis.

Main Methods:

  • A circular detector was designed and divided into 16 individually addressable segments.
  • Each segment was optically coupled with photomultiplier tubes for signal detection.
  • The detector was tested in an atomic-resolution STEM setup.

Main Results:

  • Simultaneous acquisition of 16 atomic-resolution STEM images was achieved.
  • The detector demonstrated sensitivity to the spatial distribution of scattered electrons.
  • The potential for simultaneous bright-field, low-angle annular dark-field, and high-angle annular dark-field imaging was shown.

Conclusions:

  • The new segmented detector significantly enhances STEM capabilities for atomic-resolution imaging.
  • It facilitates detailed analysis of electron scattering, enabling advanced materials characterization.
  • This technology opens avenues for novel imaging modes and quantitative analysis in electron microscopy.