AFM imaging and analysis of electrostatic double layer forces on single DNA molecules

J Sotres1, A M Baró

  • 1Instituto de Ciencia de Materiales de Madrid (Consejo Superior de Investigaciones Científicas), Madrid, Spain.

Summary

Researchers visualized electrical double layer (EDL) forces from DNA molecules using atomic force microscopy. This technique resolves DNA topography and EDL force, enabling surface charge density estimation.