Nanoscale surface photovoltage of organic semiconductors with two pass Kelvin probe microscopy

Kelvin probe microscopy implemented with controlled sample illumination is used to study nanoscale surface photovoltage effects. With this objective a two trace method, where each scanning line is measured with and without external illumination, is proposed. This methodology allows a direct comparison of the contact potential images acquired in darkness and under illumination and, therefore, the surface photovoltage is simply inferred. Combined with an appropriate data analysis, the temporal and spatial evolution of reversible and irreversible photo-induced processes can be obtained. The potential and versatility of this technique is applied to MEH-PPV thin films. Photo-physical phenomena such as the mesoscale polymer electronic light-induced response as well as the local nanoscale electro-optical properties are studied.