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Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies

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Multiwavenumber linearized diode laser spectra by overlapping frequency scans.

C B Dane, R Brüggemann, R F Curl

|May 11, 2010

Summary

This summary is machine-generated.

This study introduces a new method for diode laser spectroscopy scans. It creates long, linear, and accurately calibrated scans by piecing together shorter, computer-controlled segments.

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Area of Science:

Spectroscopy
Laser Technology
Analytical Chemistry

Background:

Diode laser spectroscopy is a powerful analytical technique.
Generating long, linear, and accurately calibrated scans can be challenging.

Purpose of the Study:

To describe a novel method for producing extended diode laser spectroscopy scans.
To ensure scans are linear in frequency and easily calibrated using reference spectra.

Main Methods:

Computer-controlled current scanning of diode lasers over short segments.
Linearization and assembly of overlapping spectral segments.
Calibration using established reference spectra.

Main Results:

Successfully produced long, linear diode laser spectroscopy scans.
Achieved accurate calibration of the generated scans.
Demonstrated a practical method for extending spectral acquisition range.

Conclusions:

The described method provides a reliable way to obtain long, linear, and accurately calibrated diode laser spectroscopy scans.
This technique enhances the utility of diode laser spectroscopy for various applications.