Related Experiment Video
Updated: Jun 13, 2026

09:38
Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
Published on: December 18, 2015
Multiwavenumber linearized diode laser spectra by overlapping frequency scans
Applied Optics
|May 11, 2010
Abstract:
A method for producing diode laser spectroscopy scans which are several wavenumbers long, linear in frequency, and readily and accurately calibrated from reference spectra is described. The laser itself is current scanned under computer control over short segments (as is normally done) and such overlapping segments are linearized and pieced together to provide the final scan.

