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Updated: Jun 13, 2026

In situ Grazing Incidence Small Angle X-ray Scattering on Roll-To-Roll Coating of Organic Solar Cells with Laboratory X-ray Instrumentation
Published on: March 2, 2021
Abstract:
A new basis is presented for the calculation of reflection coefficients of x rays by multilayer artifacts. Thin film interference is treated at an atomic plane level using an iterative 2 x 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarizations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.
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