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New measurement system for fault location in optical waveguide devices based on an interferometric technique
Applied Optics
|May 11, 2010
Summary
A novel system using two interferometers precisely locates faults in optical waveguides. It achieves high spatial resolution and detects low backscattered power, demonstrating potential for short fiber optic devices.
Area of Science:
- Optoelectronics
- Optical Engineering
- Photonics
Background:
- Accurate fault location is crucial for maintaining the performance of optical waveguide devices.
- Existing methods may lack the required spatial resolution or sensitivity for certain applications.
Purpose of the Study:
- To present a new measurement system for precise fault location in optical waveguide devices.
- To evaluate the system's spatial resolution and minimum detectable backscattered power.
Main Methods:
- The system integrates a fiber-optic Mach-Zehnder interferometer and a bulk-type Michelson interferometer.
- It measures scatter distribution to identify fault locations within optical waveguides.
Main Results:
- Achieved a spatial resolution of less than 380 micrometers, limited by averaging time.
- Demonstrated a minimum detectable backscattered power of -116 dB relative to guided light power.
- Preliminary experiments validated the system on short single-mode fibers (<10 cm).
Conclusions:
- The developed system offers high-resolution fault localization capabilities for optical waveguides.
- Its sensitivity to low backscattered power makes it suitable for analyzing short fiber optic components.
