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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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Spectroscopy of BeAl(2)O(4):Cr(3+) with application to high-temperature sensing

Devin Pugh-Thomas1, Brian M Walsh, Mool C Gupta

  • 1Department of Electrical and Computer Engineering, University of Virginia,Charlottesville, Virginia 22904, USA.

Applied Optics
|May 22, 2010
PubMed

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