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Diffuse Reflectance Infrared Spectroscopic Identification of Dispersant/Particle Bonding Mechanisms in Functional Inks
Published on: May 8, 2015
Accurate diffuse reflection measurements in the infrared spectral range.
Applied Optics
|June 5, 2010
Summary
A new sphere arrangement accurately measures directional-hemispherical reflectance from 1-15 micrometers. Comparative tests confirm no systematic uncertainties, with a deduced reflectance uncertainty of +/-0.01 for 1-5.6 micrometers.
Area of Science:
- Optical physics
- Metrology
Background:
- Accurate reflectance measurements are crucial for material characterization.
- Existing methods may have limitations in specific wavelength ranges.
Purpose of the Study:
- To evaluate the accuracy of a novel sphere arrangement for directional-hemispherical reflectance measurements.
- To determine the measurement uncertainty of the new device.
Main Methods:
- Comparative measurements using the new sphere arrangement and a fundamental PTB sphere reflectometer.
- Measurements conducted in the 1.0-1.1 micrometer spectral range.
Main Results:
- No systematic measurement uncertainties were found when comparing the new device to the PTB sphere reflectometer.
- The deduced uncertainty for reflectance measurements is +/-0.01 in the 1-5.6 micrometer wavelength range.
Conclusions:
- The tested sphere arrangement is accurate for directional-hemispherical reflectance measurements.
- The device demonstrates reliable performance within the specified wavelength range, suitable for scientific applications.
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