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Related Concept Videos

Measuring Reaction Rates03:09

Measuring Reaction Rates

Polarimetry finds application in chemical kinetics to measure the concentration and reaction kinetics of optically active substances during a chemical reaction. Optically active substances have the capability of rotating the plane of polarization of linearly polarized light passing through them—a feature called optical rotation. Optical activity is attributed to the molecular structure of substances. Normal monochromatic light is unpolarized and possesses oscillations of the electrical field in...
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Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Voltammetric Techniques: Linear-Scan (E vs Time)

Polarography is a classical voltammetric technique used to analyze electrochemical reactions. This method applies a linear potential sweep to a dropping mercury electrode (DME), and the resulting current is measured. A dropping mercury electrode is commonly used as the working electrode in polarography. It consists of a capillary tube filled with mercury, where the tiny droplet forms at the tip. This droplet continuously drops from the capillary, creating a new electrode surface for each...
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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Related Experiment Video

Updated: Jun 12, 2026

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser
09:00

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

Published on: June 28, 2018

Scanning ellipsometer by rotating polarizer and analyzer.

L Y Chen, D W Lynch

    Applied Optics
    |June 5, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A novel scanning photometric ellipsometer was developed for precise material analysis. This instrument accurately measures dielectric functions, validating its performance with gold and cadmium telluride samples.

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    High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis

    Published on: September 22, 2017

    Area of Science:

    • Materials Science
    • Optical Physics
    • Spectroscopy

    Background:

    • Ellipsometry is a powerful optical technique for characterizing thin films and surfaces.
    • Traditional ellipsometers can be limited by mechanical complexity and alignment sensitivity.
    • Developing advanced ellipsometers is crucial for accurate material property determination.

    Purpose of the Study:

    • To design and construct a new scanning photometric ellipsometer with synchronous rotating components.
    • To detail the mechanical and electrical design, alignment, calibration, and error reduction strategies.
    • To obtain complex dielectric function spectra for materials using the developed instrument.

    Main Methods:

    • Synchronous rotation of polarizer and analyzer at specific frequencies (omega(0)/2 and omega(0)).
    • Measurement of three AC components at 51 Hz, 102 Hz, and 153 Hz using a photomultiplier.
    • Acquisition of complex dielectric function spectra in the 1.5-5.5 eV energy range.

    Main Results:

    • Successful construction and detailed characterization of the scanning photometric ellipsometer.
    • Obtained complex dielectric function spectra for gold (Au) and cadmium telluride (CdTe) samples.
    • Experimental results show excellent agreement with previously reported data for Au and CdTe.

    Conclusions:

    • The new scanning photometric ellipsometer is a viable tool for material characterization.
    • The instrument's design and methodology enable accurate determination of dielectric functions.
    • This work contributes to the advancement of optical metrology for materials science.