Related Experiment Video
Updated: Jun 12, 2026

Atomic Layer Deposition of Vanadium Dioxide and a Temperature-dependent Optical Model
Published on: May 23, 2018
Optical constants for thin films of C, diamond, Al, Si, and CVD SIC from 24 A to 1216 A
Abstract:
A method for deriving optical constants from reflectance vs angle of incidence measurements using a nonlinear least-squares curve-fitting technique based on the chi(2) test of fit is presented and used to derive optical constants for several thin-film materials. The curve-fitting technique incorporates independently measured values for the film surface roughness, film thickness, and incident beam polarization. The technique also provides a direct method for estimating probable errors in the derived optical constants. Data are presented from 24 A to 1216 A for thin-film samples of C, synthetic diamond, Al, Si, and CVD SiC. Auger electron spectroscopy depth profiling measurements were performed on some of the samples to characterize sample composition including oxidation and contamination.
Related Concept Videos
Network Covalent Solids
To break or to melt a covalent network solid, covalent bonds must be broken. Because covalent bonds are relatively strong, covalent network solids are typically...
Metallic Solids
All metallic solids exhibit high thermal and electrical conductivity, metallic luster, and malleability. Many...
Law of Rational Indices
Structures of Solids

