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Updated: Jun 12, 2026
07:37
Preparation of Macroporous Epitaxial Quartz Films on Silicon by Chemical Solution Deposition
Published on: December 21, 2015
Soft x-ray reflection from silicon and quartz mirrors
Applied Optics
|June 5, 2010
Abstract:
The optical constants of silicon and quartz in the soft x-ray region (400-3750 eV) determined from the incidence-angle dependence of the specular reflectance are reported. The measured reflectance-vs-angle of incidence curves for the lower energies are quantitatively explained using a simple diffractive scattering model including the interference effect between the reflected beams, while those for the higher energies can be interpreted in terms of the microfacet model without the interference effect.
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