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Related Experiment Video

Updated: Jun 12, 2026

Preparation of Macroporous Epitaxial Quartz Films on Silicon by Chemical Solution Deposition

Preparation of Macroporous Epitaxial Quartz Films on Silicon by Chemical Solution Deposition

Published on: December 21, 2015

Soft x-ray reflection from silicon and quartz mirrors.

M Yanagihara, M Niwano, T Yamada

|June 5, 2010

Summary

This summary is machine-generated.

This study reports optical constants for silicon and quartz in the soft x-ray region. Models explain reflectance data, differentiating between lower and higher energies based on scattering and interference effects.

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Last Updated: Jun 12, 2026

Preparation of Macroporous Epitaxial Quartz Films on Silicon by Chemical Solution Deposition

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Published on: December 21, 2015

$Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples$

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Epitaxial Nanostructured α-Quartz Films on Silicon: From the Material to New Devices

Epitaxial Nanostructured α-Quartz Films on Silicon: From the Material to New Devices

Published on: October 6, 2020

Area of Science:

Materials Science
Optics
X-ray Physics

Background:

Accurate optical constants are crucial for soft x-ray applications.
Understanding material behavior under soft x-ray radiation is essential.

Purpose of the Study:

Determine the optical constants of silicon and quartz.
Investigate the energy-dependent behavior of specular reflectance.
Validate scattering models for soft x-ray interactions.

Main Methods:

Measurement of specular reflectance as a function of incidence angle.
Analysis using a diffractive scattering model with interference effects.
Application of the microfacet model for higher energies.

Main Results:

Optical constants for silicon and quartz were determined in the 400-3750 eV range.
Lower energy reflectance data matched the diffractive scattering model.
Higher energy reflectance data aligned with the microfacet model, excluding interference.

Conclusions:

The study successfully characterized silicon and quartz optical properties in the soft x-ray spectrum.
Different physical models are required to explain reflectance behavior across energy ranges.
Findings contribute to accurate modeling of soft x-ray interactions with materials.