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X-ray mirror assessment with optical light.

H Kunieda, P J Serlemitsos

    Applied Optics
    |June 10, 2010
    PubMed
    Summary
    This summary is machine-generated.

    Thin foil x-ray mirror imaging was assessed using optical light. Results show image broadening primarily from substrate waviness and slope errors, consistent with x-ray measurements.

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    Area of Science:

    • Optics
    • Materials Science
    • X-ray Astronomy

    Background:

    • Thin foil mirrors are crucial for focusing x-rays in astronomical observatories.
    • Understanding their imaging performance is vital for mission success.
    • Previous assessments often relied solely on x-ray characterization.

    Purpose of the Study:

    • To evaluate the imaging capability of a thin foil x-ray mirror using optical light.
    • To quantify contributions of substrate waviness and slope errors to image broadening.
    • To compare optical measurements with existing x-ray data.

    Main Methods:

    • Optical characterization using a laser beam and a wide optical parallel beam.
    • Analysis of image broadening in terms of half-power diameter (HPD).
    • Separation of broadening contributions from substrate waviness and slope errors.

    Main Results:

    • Millimeter-scale substrate waviness (orange peel) contributed 1.2-min of arc HPD broadening over two reflections.
    • Foil shaping and misalignment-induced slope errors caused an additional 1.6-2.0-min of arc HPD broadening.
    • Total optical broadening measured was approximately 3-min of arc HPD.

    Conclusions:

    • Optical measurements provide a valuable method for assessing thin foil x-ray mirror performance.
    • The observed optical broadening is consistent with prior x-ray measurements (2.6-min of arc HPD).
    • This study validates optical testing as a predictive tool for x-ray mirror quality.