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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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X-ray and optical profiler analysis of electroformed x-ray optics

Y Matsui, M P Ulmer, P Z Takacs

    Applied Optics
    |June 10, 2010
    PubMed

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