Related Experiment Video

Updated: Jun 12, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Normal incidence reflectance of ion beam deposited SiC films in the EUV

R A Keski-Kuha, J F Osantowski, H Herzig

    Applied Optics
    |June 10, 2010
    PubMed
    Abstract

    No abstract available in PubMed .

    More Related Videos

    Fabrication of Ultra-thin Color Films with Highly Absorbing Media Using Oblique Angle Deposition06:30

    Fabrication of Ultra-thin Color Films with Highly Absorbing Media Using Oblique Angle Deposition

    Published on: August 29, 2017

    3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry07:10

    3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

    Published on: April 29, 2020

    Related Concept Videos