Active polarization compensation and goniometer for angularly resolved light scattering measurements.

Area of Science:

• Optical Physics
• Instrumentation Science

Background:

• Accurate light scattering measurements require precise control of polarization.
• Particulate analysis in high-voltage sparks presents unique instrumentation challenges.

Purpose of the Study:

• To develop and present a method for active polarization compensation in a scanning goniometer.
• To enable accurate characterization of light scattering by particulates in high-voltage spark environments.

Main Methods:

• Individual optical element characterization using ellipsometry.
• Mueller matrix calculations to model the complete optical system.
• Utilizing the inverse of the optical system to determine required input polarization states.
• Employing a polarized source with controlled retarders for polarization state generation.

Main Results:

• Demonstration of a functional active polarization compensation method.
• Successful integration into a scanning goniometer for light scattering measurements.
• Validation of Mueller matrix modeling for system analysis.

Conclusions:

• The developed method effectively compensates for polarization changes within the goniometer.
• This technique enhances the accuracy of light scattering measurements for particulates.
• The approach provides a robust solution for polarization control in complex optical systems.