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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

Modeling of time-dependent temperature profiles in multilayer optical storage media

K E Evans, A N Burgess, R A McLean

    Applied Optics
    |June 16, 2010
    PubMed

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