Silver-magnesium fluoride cermet films. 1: Preparation and microstructure

Area of Science:

• Materials Science
• Thin Film Technology
• Surface Science

Background:

• Thin films are crucial in various technological applications.
• Understanding void formation in mixed thin films is key to controlling their properties.
• Silver-magnesium fluoride (Ag-MgF2) is a promising material system for optical and electronic applications.

Purpose of the Study:

• To investigate the void volume fraction in Ag-MgF2 thin films.
• To correlate film composition with void content.
• To analyze the microstructural evolution of these films.

Main Methods:

• Preparation of seventeen thin films with varying Ag-MgF2 compositions.
• Measurement of mass thickness using quartz crystal oscillators.
• Determination of physical thickness via stylus profilometry.
• Analysis of film microstructure using electron microscopy.

Main Results:

• Quantified void volume fraction as a function of film composition.
• Demonstrated that the Ag-MgF2 system can incorporate a high void volume fraction.
• Observed that film microstructure is dependent on composition, thickness, and substrate.

Conclusions:

• The Ag-MgF2 system offers significant potential for creating porous thin films.
• Film microstructure and void content are controllable through composition, thickness, and substrate selection.
• These findings are relevant for optimizing thin film performance in various applications.