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Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer
Applied Optics
|June 18, 2010
Abstract:
A technique is presented for measuring small displacements by observing the frequency of spectral modulation of white light in a Michelson interferometer. An experiment is described in which the step size of a stepper-motor-driven translation stage was measured by recording the spectrum of light output from an interferometer and performing a cross-correlation calculation with theoretical spectra. Measurements made using standard laboratory-quality optical equipment were accurate to within ~10 nm for a range of over 100 microm.
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