Related Experiment Video
Updated: Jun 12, 2026

Dosimetry for Cell Irradiation using Orthovoltage (40-300 kV) X-Ray Facilities
Published on: February 20, 2021
Determination of the linear attenuation range of electron transmission through film specimens
Fang Wang1, Hai-Bo Zhang, Meng Cao
1Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi'an Jiaotong University, Xi'an, People's Republic of China.
Abstract:
We have investigated the linear attenuation range of electron transmission through film specimens and its dependence on the electron energy, the acceptance half-angle of a detector or an objective aperture, and specimen properties, in the scanning transmission electron microscope (STEM) and the conventional transmission electron microscope (TEM). Electron transmission in the bright-field mode was calculated by the Monte Carlo simulation of electron scattering, and its range of the linear attenuation in film thickness was then determined by a linear least squares fit. The corresponding linear thickness range was shown to increase with the electron energy and the acceptance half-angle, although it decreased with the increase in the atomic number of specimen materials. Under the condition of a 300kV STEM or a 3MV ultra-high voltage electron microscope (ultra-HVEM), the linear attenuation range could extend to several microns for light specimen materials, and this was validated by experimental data in the ultra-HVEM. The presented results can be helpful for accurately measuring the specimen thickness or mass from electron transmission, and estimating the deviation of electron transmission from linearity when tilting a specimen in electron tomography.
More Related Videos
06:20Irradiator Commissioning and Dosimetry for Assessment of LQ α and β Parameters, Radiation Dosing Schema, and in vivo Dose Deposition
Published on: March 11, 2021
08:46Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
Related Concept Videos
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Transmission Electron Microscopy
Overview of Electron Microscopy
Determination of Crystal Structures