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A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
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Image blurring of thick specimens due to MeV transmission electron scattering: a Monte Carlo study

Fang Wang1, Hai-Bo Zhang, Meng Cao

  • 1Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi'an Jiaotong University, Xi'an, People's Republic of China.

Journal of Electron Microscopy
|July 21, 2011
PubMed

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