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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
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IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
X-ray Diffraction of Biological Samples01:10

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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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A bi-prism interferometer for hard X-ray photons.

A F Isakovic1, A Stein, J B Warren

  • 1Brookhaven National Laboratory, Upton, NY 11973, USA.

Journal of Synchrotron Radiation
|June 23, 2010
PubMed
Summary

Micro-fabricated bi-prisms generate interference patterns from hard X-ray beams. High fringe visibility was achieved using nano-probes and single-crystal materials, enabling detailed analysis of X-ray coherence.

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Area of Science:

  • Physics
  • Materials Science
  • Nanotechnology

Background:

  • Interference patterns are crucial for analyzing wave properties.
  • Hard X-ray applications require precise control over beam characteristics.
  • Micro-fabrication offers advanced tools for manipulating X-ray beams.

Purpose of the Study:

  • To investigate the use of micro-fabricated bi-prisms for generating hard X-ray interference patterns.
  • To probe the intensity of these patterns using fluorescence.
  • To analyze the transverse coherence lengths of the X-ray beam.

Main Methods:

  • Utilized micro-fabricated bi-prisms to create interference patterns from hard X-ray beams.
  • Employed fluorescence from a 30 nm-thick metal film to probe pattern intensity.
  • Conducted near-field analysis to describe fringe field intensities.
  • Extracted transverse coherence lengths at APS beamline 8-ID-I.

Main Results:

  • Achieved maximum fringe visibility exceeding 0.9.
  • Demonstrated that maximum fringe number depends solely on the prism's complex refractive index.
  • Successfully extracted transverse coherence lengths.

Conclusions:

  • Micro-fabricated bi-prisms are effective for generating high-visibility hard X-ray interference patterns.
  • Nano-probes and single-crystal materials significantly enhance fringe visibility.
  • Near-field analysis is essential for understanding fringe field intensities and X-ray coherence.