Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

$Interference and Diffraction$ 02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.

Radiation Pressure: Problem Solving

Radiation Pressure: Problem Solving

The radiation pressure applied by an electromagnetic wave on a perfectly absorbing surface equals the energy density of the wave. The wave's momentum also gets transferred to the surface when an electromagnetic wave is entirely absorbed by it. The rate at which momentum is transmitted to an absorbing surface perpendicular to the propagation direction equals the force on the surface.
The average value of the rate of momentum transfer divided by the absorbing area represents the average force per...

Surface Area Calculations

Surface Area Calculations

Surface area calculations for a graph z = f(x, y) are fundamental in engineering applications involving curved structures such as satellite dishes. A parabolic dish reflects communication signals efficiently, but engineers must determine its exact curved surface area to estimate coating materials, fabrication costs, and structural requirements. Since the rim of the dish forms a circular boundary, the surface area is calculated over a circular domain in the xy-plane.Parametric Representation of...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

The Measurement and Uncertainty of a Calibration Standard for the Scanning Electron Microscope.

Journal of research of the National Institute of Standards and Technology·2023

Same author

Surface Roughness Studies with DALLAS-Detector Array for Laser Light Angular Scattering.

Journal of research of the National Bureau of Standards (1977)·2021

Same author

Microform Calibration Uncertainties of Rockwell Diamond Indenters.

Journal of research of the National Institute of Standards and Technology·2017

Same author

Standard Reference Specimens in Quality Control of Engineering Surfaces.

Journal of research of the National Institute of Standards and Technology·2017

Same author

Topography measurements and applications in ballistics and tool mark identifications.

Surface topography : metrology and properties·2016

Same author

The Second National Ballistics Imaging Comparison (NBIC-2).

Journal of research of the National Institute of Standards and Technology·2015

Search research articles

Related Experiment Video

Updated: Jun 11, 2026

Measuring Spatially- and Directionally-varying Light Scattering from Biological Material

Measuring Spatially- and Directionally-varying Light Scattering from Biological Material

Published on: May 20, 2013

Direct and inverse problems for light scattered by rough surfaces.

E Marx, T V Vorburger

|June 23, 2010

Summary

This study connects surface roughness profiles to light scattering patterns. Researchers used calculations and measurements to analyze surface characteristics and light interactions, finding partial agreement between methods.

Area of Science:

Optics and Photonics
Surface Science
Metrology

Background:

Understanding light scattering from rough surfaces is crucial for various optical applications.
Characterizing surface topography accurately is essential for material science and engineering.

Purpose of the Study:

To establish a relationship between a surface's stylus profile and its light scattering angular distribution.
To investigate the direct and inverse problems of light scattering for surface characterization.

Main Methods:

Performing calculations to link stylus profiles to scattered light angular distribution.
Comparing calculated scattered light distributions with measured data.
Employing a least-squares fit to determine surface parameters from measured angular distributions.

More Related Videos

Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses

Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses

Published on: June 6, 2017

Scattering And Absorption of Light in Planetary Regoliths

Scattering And Absorption of Light in Planetary Regoliths

Published on: July 1, 2019

Related Experiment Videos

Last Updated: Jun 11, 2026

Measuring Spatially- and Directionally-varying Light Scattering from Biological Material

Measuring Spatially- and Directionally-varying Light Scattering from Biological Material

Published on: May 20, 2013

Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses

Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses

Published on: June 6, 2017

Scattering And Absorption of Light in Planetary Regoliths

Scattering And Absorption of Light in Planetary Regoliths

Published on: July 1, 2019

Main Results:

Calculated angular distributions from surface profiles showed agreement with measured data in the direct problem.
Root-mean-square (rms) roughness and autocorrelation functions were determined via least-squares fitting.
For smoother surfaces, rms roughness correlated with the ratio of specular to total scattered light power.

Conclusions:

The study successfully related surface topography to light scattering characteristics.
While the inverse problem provided parameter estimations, they were subject to errors and showed only partial agreement with direct stylus profile measurements.