High order statistics based blind deconvolution of bi-level images with unknown intensity values
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11Department of Electronics Engineering, Ewha Womans University, 11-1 Daehyun-Dong, Seodaemun-Gu, Seoul, Korea. jtkim@ewha.ac.kr
Abstract:
We propose a novel linear blind deconvolution method for bi-level images. The proposed method seeks an optimal point spread function and two parameters that maximize a high order statistics based objective function. Unlike existing minimum entropy deconvolution and least squares minimization methods, the proposed method requires neither unrealistic assumption that the pixel values of a bi-level image are independently identically distributed samples of a random variable nor tuning of regularization parameters.We demonstrate the effectiveness of the proposed method in simulations and experiments.
