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Updated: Jun 11, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Abdelsalam A Aboketaf1, Ali W Elshaari, Stefan F Preble
1Microsystems Engineering, Kate Gleason College of Engineering, Rochester Institute of Technology, Rochester, New York 14623, USA. axa8863@rit.edu
Researchers developed a novel silicon chip optical time division multiplexer (OTDM). This compact device boosts a 5 Gb/s signal to 20 Gb/s and 40 Gb/s, ideal for optical networks.
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