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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

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Accuracy in Dental Medicine, A New Way to Measure Trueness and Precision
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A systematic method for predetermined scanning electron microscope analysis in dental science.

Silvia Marchionni1, Paolo Baldissara, Carlo Monaco

  • 1Department of Oral Sciences, Laboratory of Microscopy, Alma Mater Studiorum, University of Bologna, Bologna, Italy. silvia.marchionni@unibo.it

Scanning
|August 10, 2010
PubMed
Summary
This summary is machine-generated.

This study introduces a systematic method for scanning electron microscope (SEM) evaluations to ensure operator impartiality and repeatability. The described SEM observation technique achieved 100% repeatable frames, minimizing bias in scientific research.

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Area of Science:

  • Materials Science
  • Microscopy Techniques
  • Scientific Methodology

Background:

  • Scanning electron microscope (SEM) evaluations are susceptible to observer bias.
  • Unconscious selection of images can compromise research integrity and impartiality.
  • A standardized method is needed to ensure objective SEM data collection.

Purpose of the Study:

  • To describe and verify a systematic observation method for SEM evaluations.
  • To enhance the repeatability and reduce bias in SEM image acquisition.
  • To provide a framework for objective SEM-based research.

Main Methods:

  • A systematic observation method with predetermined specimen points and observation rules was developed.
  • The method was verified for repeatability under specific operating magnifications (500x-1,000x).
  • A scheme for number and observation points was established within a research protocol.

Main Results:

  • The systematic method demonstrated 100% repeatable observation frames.
  • Linear frame errors in locating observation points were measured at 12.5% (length) and 16.8% (height).
  • The method ensures consistent data collection, crucial for SEM analysis.

Conclusions:

  • The developed systematic observation method significantly improves objectivity in SEM evaluations.
  • This technique is verifiable for repeatability and minimizes operator bias.
  • The method is adaptable for various research objectives and statistical needs in SEM studies.