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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Amjad Hussain1, Eduardo Villarreal-Barajas, Derek Brown
1Department of Medical Physics, Tom Baker Cancer Centre, University of Calgary, Calgary, Alberta, Canada. Amjad.Hussain@albertahealthservices.ca
The Eclipse AAA algorithm accurately predicts dose distributions for total body irradiation (TBI) at extended source-to-surface distances (SSD). This validates its use in TBI planning, even when commissioned at standard SSD.
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