Related Experiment Video
Updated: Jun 10, 2026

05:57
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Performance analysis of Givens rotation-integrated optical interdigitated-electrode cross-channel Bragg diffraction
Applied Optics
|August 20, 2010
Abstract:
The effects of extrinsic and inherent errors are analyzed for the integrated optical Givens rotation device. The extrinsic errors, caused by inaccurate voltage applied to the grating and inaccurate detection, are found to be important. The inherent errors caused by the propagation of these inaccuracies are detailed in algorithms for analog norm computation and in the QR algorithm for numerical linear algebra. A calibration procedure is developed to eliminate most of the errors.
